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IVD 2 & rf-IVD 2 Publications

IVD 2 & rf-IVD 2 Publications

Click on a publication below to view it on the journal website.

Quality Contra Complexity in IVD. A Comparative Study Between Three Semiconductor Detectors

G Rikner et al., Med. Phys. 33, 2132 (2006)

 

Energy dependence of a new solid state diode for low energy photon beam dosimetry

Saw CB et al., Med Dosim. 1998 Summer;23(2):95-7.

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Xiel Limited is registered in England & Wales
Reg. Co. No: 11875702
VAT. No: 327 0808 11

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2 Yelling Mill,
Yelling Mill Lane,
Shepton Mallet,
Somerset,
BA4 4JT

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Xiel Limited
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Head Office : 01749 372217

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