Logos Systems

Logos Systems manufactures XRV electronic beam metrology systems, providing real-time 3D beam vector, profile and divergence capture in seconds. XRV systems measure proton and X-ray beam position with 0.3mm accuracy and 0.03mm repeatability for stereotactic and high-precision radiotherapy QA.

The XRV 124 phantom captures beam vectors and profiles during full 360° gantry rotation, enabling comprehensive testing for CyberKnife, VMAT and pencil beam scanning. XRV systems simultaneously verify gantry, robotic arm, collimator, MLC/Iris, couch, kV imagers, radiation source and room lasers in single tests. Their hodoscope-based design uses scintillator imaging with sensitive CCD cameras for 3D reconstruction. XRV provides filmless Winston-Lutz, star shot analysis, MLC sliding window tests, VMAT capture and 3D fluence reconstruction.

BeamWorks and ArcWorks software supports trend analysis and multi-beam visualisation. Systems weigh 8kg with 30-metre fibre optic connection enabling remote operation during QA.